The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2018
Filed:
Apr. 16, 2013
Renishaw Plc, Wotton-under-Edge, Gloucestershire, GB;
RENISHAW PLC, Wotton-Under-Edge, GB;
Abstract
A method of scanning an object using an analog probe mounted on a machine tool, so as to collect scanned measurement data along a nominal measurement line on the surface of the object, the analog probe having a preferred measurement range. The method includes controlling the analog probe and/or object to perform a scanning operation in accordance with a course of relative motion, the course of relative motion being configured such that, based on assumed properties of the surface of the object, the analog probe will be caused to obtain data within its preferred measuring range, as well as cause the analog probe to go outside its preferred measuring range, along the nominal measurement line on the surface of the object.