The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2018

Filed:

Nov. 13, 2017
Applicant:

Invis Technologies Corporation, Sunnyvale, CA (US);

Inventors:

Gregory J. Kintz, Santa Cruz, CA (US);

Philip J. Stephanou, Mountain View, CA (US);

Kurt E. Petersen, Milpitas, CA (US);

Srinivasan K. Ganapathi, Palo Alto, CA (US);

John Batey, Incline Village, NV (US);

Assignee:

INVIS Technologies Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/33 (2006.01); G02B 3/00 (2006.01); G02B 5/18 (2006.01); G02B 27/42 (2006.01); H04N 5/378 (2011.01); G02B 13/18 (2006.01); G02B 13/14 (2006.01);
U.S. Cl.
CPC ...
G02B 3/0087 (2013.01); G02B 5/1842 (2013.01); G02B 5/1876 (2013.01); G02B 5/1885 (2013.01); G02B 13/14 (2013.01); G02B 13/18 (2013.01); G02B 27/4205 (2013.01); G02B 27/4272 (2013.01); H04N 5/33 (2013.01); H04N 5/378 (2013.01);
Abstract

A gradient-index lens for directing incident electromagnetic radiation comprises at least one substrate having a plurality of micro-features (e.g., trenches or holes) that may be arranged in a pattern of varied size and/or spacing. Each of the micro-features has at least one dimension that is less than a wavelength of the electromagnetic radiation. The spacing between adjacent micro-features is less than the wavelength of the electromagnetic radiation, and the size and spacing of the micro-features are sufficient to produce an effective refractive index profile of the lens that is graded.


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