The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2018
Filed:
Apr. 06, 2012
Applicants:
Charles Leyder, Paris, FR;
Claire Thoumazet, Paris, FR;
Martin Python, Vesin, CH;
Inventors:
Assignee:
SAINT-GOBAIN PERFORMANCE PLASTICS CORPORATION, Solon, OH (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B32B 7/02 (2006.01); B32B 15/08 (2006.01); C23C 14/35 (2006.01); C23C 16/50 (2006.01); B05D 1/36 (2006.01); G02B 1/10 (2015.01); C03C 17/42 (2006.01); H01L 51/00 (2006.01); H01L 51/52 (2006.01); G02B 1/16 (2015.01); G02B 1/11 (2015.01); H01L 27/30 (2006.01); H01L 27/32 (2006.01);
U.S. Cl.
CPC ...
G02B 1/10 (2013.01); C03C 17/42 (2013.01); H01L 51/0097 (2013.01); H01L 51/5256 (2013.01); G02B 1/11 (2013.01); G02B 1/16 (2015.01); H01L 27/301 (2013.01); H01L 27/32 (2013.01); H01L 51/5281 (2013.01); H01L 2251/5338 (2013.01); Y02E 10/549 (2013.01); Y10T 428/24942 (2015.01); Y10T 428/265 (2015.01); Y10T 428/3154 (2015.04); Y10T 428/31507 (2015.04); Y10T 428/31536 (2015.04); Y10T 428/31544 (2015.04); Y10T 428/31551 (2015.04); Y10T 428/31678 (2015.04); Y10T 428/31721 (2015.04); Y10T 428/31725 (2015.04); Y10T 428/31786 (2015.04); Y10T 428/31935 (2015.04);
Abstract
This multilayer component () for encapsulating an element () which is sensitive to air and/or moisture comprises an organic polymer layer () and at least one barrier stack (). The barrier stack () comprises at least three successive thin layers (-) having alternately lower and higher degrees of crystallinity, the ratio of the degree of crystallinity of a layer of higher degree of crystallinity to the degree of crystallinity of a layer of lower degree of crystallinity being greater than or equal to 1.1.