The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2018

Filed:

Apr. 17, 2015
Applicant:

Microseismic, Inc., Houston, TX (US);

Inventors:

Leo Eisner, Prague, CZ;

Frantisek Stanek, Plzen, CZ;

Jan Valenta, Prague, CZ;

Assignee:

Microseismic, Inc., Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/28 (2006.01);
U.S. Cl.
CPC ...
G01V 1/288 (2013.01); G01V 2210/123 (2013.01); G01V 2210/1234 (2013.01); G01V 2210/65 (2013.01);
Abstract

A method for determining hypocenters of microseismic events includes entering as input to a computer seismic signals recorded by a plurality of seismic sensors disposed proximate a volume of subsurface to be evaluated. For each point in space in the volume, and for a plurality of preselected origin times, a seismic energy arrival time at each seismic sensor is determined. Event amplitudes for each arrival time are determined. A synthetic event amplitude is calculated for each arrival time. A semblance between the determined event amplitudes and the synthetic event amplitudes is determined. Existence of an actual microseismic is determined event when the semblance exceeds a selected threshold.


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Eisner, Leo. (2018). Method of using semblance of corrected amplitudes due to source mechanisms for microseismic event detection and location (U.S. Patent No. 10036819). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10036819

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