The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2018

Filed:

Mar. 05, 2015
Applicant:

Big Sky Financial Corporation, Oviedo, FL (US);

Inventors:

James E. Retterath, Excelsior, MN (US);

Robert A. Laumeyer, Eden Prairie, MN (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 7/48 (2006.01); G01S 7/486 (2006.01); G01S 17/89 (2006.01); G01S 17/10 (2006.01); G01S 17/93 (2006.01); G01S 7/481 (2006.01);
U.S. Cl.
CPC ...
G01S 7/4802 (2013.01); G01S 7/4815 (2013.01); G01S 7/4865 (2013.01); G01S 17/10 (2013.01); G01S 17/89 (2013.01); G01S 17/936 (2013.01);
Abstract

Methods, systems, and computer program products for acquiring three-dimensional LiDAR information of a scene are disclosed. According to one aspect, acquiring three-dimensional information includes emitting N pulses in a sequence with each successive pulse having a relative time shift to the sampling reference, thus producing a reconstructed sampled signal with an effective sampling rate of N times the sampling reference. According to another aspect, acquiring three-dimensional information includes emitting two or more frequencies, the differences of each pair of differing frequencies being designated as Δf, and sampling the return information with the use of a sampling reference. Frequency analysis is performed on the sampled information to determine the reference times at which the Δf signals occur and the signal intensity of the Δf signals at each time. Systems as described herein can be utilized for autonomous vehicle navigation, collision avoidance and navigation systems for UAVs, roadway surface texture analysis, non-contact friction analysis, and in-motion deflectometer measurement.


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