The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2018
Filed:
Sep. 21, 2016
Applicant:
Sony Corporation, Tokyo, JP;
Inventor:
Shinji Komiyama, Saitama, JP;
Assignee:
SONY CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02J 50/12 (2016.01); H02J 17/00 (2006.01); G01R 15/18 (2006.01); H02J 50/80 (2016.01); H02J 50/60 (2016.01); G01R 21/00 (2006.01); G01V 3/10 (2006.01); G06F 17/00 (2006.01); H02J 4/00 (2006.01); H02J 7/02 (2016.01); H02J 5/00 (2016.01);
U.S. Cl.
CPC ...
G01R 15/18 (2013.01); G01R 21/006 (2013.01); G01V 3/10 (2013.01); G06F 17/00 (2013.01); H02J 4/00 (2013.01); H02J 7/025 (2013.01); H02J 17/00 (2013.01); H02J 50/12 (2016.02); H02J 50/60 (2016.02); H02J 50/80 (2016.02); H02J 5/005 (2013.01);
Abstract
Disclosed herein is a detection apparatus including: a resonant circuit provided with a Q-factor measurement coil and one or more capacitors to serve as a circuit for receiving pulses; a response-waveform detecting section configured to detect the waveform of a response output by the resonant circuit in response to the pulses; and a Q-factor measuring section configured to measure a Q factor of the resonant circuit from the response waveform detected by the response-waveform detecting section. It is possible to increase the precision of detection of a metallic foreign substance existing between a power transmitting side and a power receiving side.