The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2018
Filed:
Jan. 29, 2016
Sartorius Lab Instruments Gmbh & Co. KG, Goettingen, DE;
Winfried Graf, Niemetal, DE;
Friedrich Helmsen, Goettingen, DE;
Detlev Erben, Goettingen, DE;
Helga Covic, Goettingen, DE;
Tanja Mueck, Langelsheim, DE;
Sartorius Lab Instruments GmbH & CO. KG, Goettingen, DE;
Abstract
A method for producing a force-measuring element () having at least one articulation point () which separates one region of the force-measuring element () into two connected subregions () which can be deflected in relation to one another. The method includes: providing a force-measuring element blank (), removing material from the force-measuring element blank () in order to produce the articulation point (), checking whether the deflection behavior of the subregions () which is produced by the articulation point corresponds to a predefined specification, defining a correction form () which can be produced through material removal and compensates for an ascertained deviation from the predefined specification, correcting the articulation point geometry using a laser and the previously defined correction form (), through material removal at the articulation point.