The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2018
Filed:
Apr. 13, 2015
Zf Friedrichshafen Ag, Friedrichshafen, DE;
Magnachek, Madison Heights, MI (US);
Harold Hopkinson, III, Farmington Hills, MI (US);
Wally Lawrence, Madison Heights, MI (US);
Eric Holmes, Northville, MI (US);
Joel Lautermilch, Northville, MI (US);
Tracy Holmes, Northville, MI (US);
ZF Friedrichshafen AG, Friedrichshafen, DE;
Magnachek, Madison Heights, MI (US);
Abstract
A method and system for determining a hardness of a component to be tested by utilizing an ultrasonic meter. The method and system both comprise selecting a component to be tested which has a longitudinal axis; positioning a probe of the ultrasonic meter for emitting a signal from an emitter of the probe into an end surface of the component to be tested and along the longitudinal axis of the component; emitting the signal from the emitter of the probe into the first surface of the component to be tested; passing the emitted signal through the component to be tested; reflecting the emitted signal via an opposed second surface of the component to be tested back toward a detector of the probe; detecting the reflected signal via the detector of the probe; and determining a hardness of the component to be tested based upon a velocity of the emitted signal.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile