The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2018

Filed:

Nov. 12, 2013
Applicant:

Northeastern University, Boston, MA (US);

Inventors:

Bo Li, Malden, MA (US);

Ji Hao, Boston, MA (US);

Hyun Young Jung, Malden, MA (US);

Yung Joon Jung, Lexington, MA (US);

Swastik Kar, Belmont, MA (US);

Assignee:

Northeastern University, Boston, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/70 (2006.01); G01N 27/62 (2006.01); H01J 41/02 (2006.01); H01J 47/02 (2006.01); H01J 49/02 (2006.01);
U.S. Cl.
CPC ...
G01N 27/70 (2013.01); G01N 27/62 (2013.01); H01J 41/02 (2013.01); H01J 47/02 (2013.01); H01J 49/025 (2013.01);
Abstract

An ion detection device has a strip of carbon-based nanomaterial (CNM) film and a chamber enclosing the CNM film. A low bias voltage is applied at the ends of the CNM film strip, and ions present in the chamber are detected by a change in the magnitude of current flowing through the CNM film under the bias. Also provided are methods for fabricating the device, methods for measuring pressure of a gas, and methods for monitoring or quantifying an ionizing radiation using the device.


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