The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2018
Filed:
Dec. 19, 2014
Nuctech Company Limited, Haidian District, Beijing, CN;
Tsinghua University, Haidian District, Beijing, CN;
Ziran Zhao, Beijing, CN;
Li Zhang, Beijing, CN;
Yingying Geng, Beijing, CN;
Hongqiu Wang, Beijing, CN;
Yumin Yi, Beijing, CN;
Nuctech Company Limited, Haidian District, Beijing, CN;
Tsinghua University, Haidian District, Beijing, CN;
Abstract
Embodiments of the present invention provide jewel and jade identification method and apparatus. The method comprises the steps: (a) placing a sample to be detected over a light transmission hole formed on a carrying surface of an object table and emitting, by an optical probe disposed below the carrying surface, an exciting light onto the sample through the light transmission hole and then collecting a Raman scattered light from the sample by the optical probe. (b) acquiring a Raman spectrum curve of the sample from the collected Raman scattered light from the sample; and (c) comparing the Raman spectrum curve with a reference Raman spectrum library for jewels and jades to identify the sample. The method and apparatus may achieve effective, convenient and accurate inspections of the jewels and jades.