The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2018

Filed:

Nov. 05, 2012
Applicant:

Schlumberger Technology Corporation, Sugar Land, TX (US);

Inventors:

Prasanna Kumar Tellapaneni, Mumbai, IN;

Richard Jackson, Norwich, GB;

Sourabh Shukla, Mumbai, IN;

Harshad Dixit, Dehradun, IN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
E21B 49/00 (2006.01); G01V 11/00 (2006.01);
U.S. Cl.
CPC ...
E21B 49/00 (2013.01); E21B 49/008 (2013.01); G01V 11/002 (2013.01);
Abstract

A methodology for IPTT (interval pressure transient testing) design which allows estimation of the reliability of the transient tests. A normally distributed random noise is superimposed on analytical pressure profile computed for a given formation, PVT, and gauge metrology. The IPTT success in a particular environment is estimated based on the theoretical pressure derivative and noise superimposed pressure derivative. This approach is repeated for a range of rock, fluid properties, and practical limits, for a successful IPTT.


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