The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2018
Filed:
Nov. 28, 2013
Applicant:
Beijing Tag-array Molecular Test Co., Ltd, Beijing, CN;
Inventors:
Hong Jiang, Beijing, CN;
Suwen Yue, Beijing, CN;
Tongbing Liao, Beijing, CN;
Bisheng Jiang, Beijing, CN;
Yue Qu, Beijing, CN;
Yukang Jiang, Beijing, CN;
Assignee:
BEIJING TAG-ARRAY MOLECULAR TEST CO., LTD., Beijing, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12P 19/34 (2006.01); C12Q 1/686 (2018.01); C12Q 1/6848 (2018.01);
U.S. Cl.
CPC ...
C12Q 1/686 (2013.01); C12Q 1/6848 (2013.01);
Abstract
Provided is a primer middle sequence interference PCR method, and the method uses one segment of a non-complemented or same-sequence base of the middle sequence of primers to perform antisense interference inside and outside the primer molecules, so as to competitively destroy the polymerization among the primers to selectively inhibit amplification of the primer dimer (PD).