The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2018
Filed:
Sep. 13, 2016
Fanuc Corporation, Yamanashi, JP;
Yuusuke Murata, Yamanashi, JP;
FANUC CORPORATION, Yamanashi, JP;
Abstract
A measurement system able to perform measurement by a simpler manner when performing measurement a plurality of times for a plurality of targets. The measurement system utilizes the light receiving device to measure targets fastened to the machine tool. The robot is moved so that the difference between a target on a light receiving surface of the light receiving device and an image acquired by the light receiving device in the state where the machine tool is stopped at each stop position and the robot is placed in the measurement position and posture becomes within a predetermined error. A plurality of stop positions and a plurality of end point positions and postures after the movement are used as the basis to simultaneously find the error of the mechanical parameters of the robot and the relative relationship between the robot coordinate system Σb and the machine tool coordinate system Σm.