The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 31, 2018

Filed:

Sep. 30, 2014
Applicants:

Fujifilm Manufacturing Europe B.v., Tilburg, NL;

Fujifilm Corporation, Tokyo, JP;

Inventors:

Mayur Dalwani, Tilburg, NL;

Shigehide Itoh, Tilburg, NL;

Erik Vermeer, Tilburg, NL;

Maarten Meijlink, Tilburg, NL;

Yujiro Itami, Tilburg, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D 69/12 (2006.01); B01D 53/22 (2006.01); B01D 69/10 (2006.01); B01D 69/02 (2006.01); B01D 71/32 (2006.01); B01D 71/64 (2006.01);
U.S. Cl.
CPC ...
B01D 69/12 (2013.01); B01D 53/228 (2013.01); B01D 69/02 (2013.01); B01D 69/105 (2013.01); B01D 71/32 (2013.01); B01D 71/64 (2013.01); B01D 2323/30 (2013.01); B01D 2323/345 (2013.01); B01D 2325/04 (2013.01);
Abstract

A composite membrane comprising: a) a porous support; b) a gutter layer; and c) a discriminating layer which satisfies Formula (1): wherein: Ø is <4; x is the arithmetic mean of N measurements of the thickness of the discriminating layer and has a value of between 30 and 150 nm; N is at least 100; xis the thickness in nm of an individual measurement of thickness within the N measurements; x>x>0; and n is the number of individual thickness measurements where x>x, >0


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