The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
Feb. 05, 2015
Bar Ilan University, Ramat Gan, IL;
Zeev Zalevsky, Rosh HaAyin, IL;
Moshe Arie Ariel Schwarz, Bnei Brak, IL;
Amir Shemer, Petach Tikva, IL;
Alexander Zlotnik, Ashdod, IL;
BAR ILAN UNIVERSITY, Ramat Gan, IL;
Abstract
A method and system are provided, for imaging a region of interest with pinhole based imaging. The method comprising: collecting input radiation from the region of interest through a selected set of a plurality of a predetermined number of aperture arrays, each array having a predetermined arrangement of apertures and collecting the input radiation during a collection time period, wherein said selected set of the aperture arrays and the corresponding collection time periods defining a total effective transmission function of the radiation collection, generating image data from the collected input radiation, said image data comprising said predetermined number of image data pieces corresponding to the input radiation collected through the aperture arrays respectively, processing the image data pieces utilizing said total effective transmission function of the radiation collection, and determining a restored image of the region of interest. The set of aperture arrays is preferably selected such that said total effective transmission function provides non-null transmission for spatial frequencies being lower than a predetermined maximal spatial frequency.