The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2018

Filed:

Sep. 01, 2016
Applicant:

Sam Houston State University, Huntsville, TX (US);

Inventor:

Qingzhong Liu, The Woodlands, TX (US);

Assignee:

Sam Houston State University, Huntsville, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G06K 9/46 (2006.01); G06K 9/52 (2006.01); H04N 7/167 (2011.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G06K 9/00899 (2013.01); G06K 9/4609 (2013.01); G06K 9/522 (2013.01); G06T 2207/20052 (2013.01);
Abstract

Methods and systems of detecting tampering in a digital image includes using hybrid large feature mining to identify one or more regions of an image in which tampering has occurred. Detecting tampering in a digital image with hybrid large feature mining may include spatial derivative large feature mining and transform-domain large feature mining. In some embodiments, known ensemble learning techniques are employed to address high feature dimensionality. detecting inpainting forgery includes mining features of a digital image under scrutiny based on a spatial derivative, mining one or more features of the digital image in a transform-domain; and detecting inpainting forgery in the digital image under scrutiny at least in part by the features mined based on the spatial derivative and at least in part by the features mined in the transform-domain.


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