The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
May. 02, 2016
BO Pang, Beijing, CN;
Shengyin Fan, Beijing, CN;
Xin Wang, Beijing, CN;
Qian Wang, Beijing, CN;
Gang Wang, Beijing, CN;
Bo Pang, Beijing, CN;
Shengyin Fan, Beijing, CN;
Xin Wang, Beijing, CN;
Qian Wang, Beijing, CN;
Gang Wang, Beijing, CN;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
A method and an apparatus for detecting an abnormal situation are disclosed. The method includes recognizing whether a detection target exists in a captured image; generating, based on the captured image, a three-dimensional point cloud of the detection target in the captured image, when the detection target exists; obtaining, based on the generated three-dimensional point cloud, one or more current posture features of the detection target; and determining, based on the current posture features and one or more predetermined posture feature standards, whether the abnormal situation exists, the posture feature standards being previously determined based on one or more common features when the detection target performs a plurality of abnormal actions.