The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2018

Filed:

Dec. 14, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Florian Braun, Stuttgart, DE;

Lukas Daellenbach, Altdorf, DE;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/455 (2018.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5081 (2013.01); G06F 2217/06 (2013.01);
Abstract

A method is provided for facilitating an integrated circuit design layout. The method includes receiving a netlist including a plurality of subnets. For each subnet, the method also includes obtaining a Steiner net length value and related net delays in a signal path for a metal wiring layer using timings of all involved circuits of the subnet, and determining whether the net delay is smaller than a predefined value. On a negative outcome of the determination, a wire delay is ascertained for the named metal wiring layer based on a maximum buffer distance retrieved from a cycle reach table, and determining whether the ascertained wire delay is below the related net delay. On a positive outcome of the second determination, a next increased metal wire width is selected and a metal wire based wire delay for the named metal wiring layer including a buffer is ascertained.


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