The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2018

Filed:

Oct. 08, 2015
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Haruhiko Terada, Kanagawa, JP;

Lui Sakai, Kanagawa, JP;

Hideaki Okubo, Saitama, JP;

Keiichi Tsutsui, Kanagawa, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01); G06F 12/16 (2006.01); G06F 11/22 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 12/16 (2013.01); G06F 11/22 (2013.01); G06F 11/1441 (2013.01);
Abstract

To suppress the degradation of memory cells in a non-volatile memory. A read processing unit performs a read process for reading read data from each of a plurality of memory cells on the basis of a first threshold. An error detection unit detects presence or absence of an error in the read data and specifies memory cells in which the error is present among the plurality of memory cells. A re-read processing unit performs a re-read process for reading data, as re-read data, from the specified memory cells on the basis of a second threshold different from the first threshold. A refresh processing unit rewrites, for a memory cell of which the re-read data has a different value from the read data among the specified memory cells, data with the re-read data as a refresh process.


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