The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
Dec. 10, 2015
Vmware, Inc., Palo Alto, CA (US);
Xiaojin Wu, Shanghai, CN;
Pin Xie, Shanghai, CN;
Shi Chen, Shanghai, CN;
Biwen Li, Shanghai, CN;
Yan Su, Shanghai, CN;
VMware, INC., Palo Alto, CA (US);
Abstract
An example method is described to provide fault tolerance in a virtualized computing environment with a first fault domain and a second fault domain. The method may comprise determining whether a first primary virtualized computing instance and a first secondary virtualized computing instance are both in the first fault domain. The method may comprise: in response to determination that the first primary virtualized computing instance and first secondary virtualized computing instance are both in the first fault domain, selecting a second secondary virtualized computing instance from the second fault domain; migrating the first secondary virtualized computing instance from a first host to a second host; and migrating the second secondary virtualized computing instance from the second host to the first host, thereby swapping the first secondary virtualized computing instance in the first fault domain with the second secondary virtualized computing instance in the second fault domain.