The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2018

Filed:

May. 16, 2014
Applicants:

Mitsui Chemicals, Inc., Tokyo, JP;

Murata Manufacturing Co., Ltd., Nagaokakyo-shi, Kyoto, JP;

Inventors:

Mitsunobu Yoshida, Ichihara, JP;

Kazuhiro Tanimoto, Nagoya, JP;

Shigeo Nishikawa, Chiba, JP;

Assignees:

MITSUI CHEMICALS, INC., Minato-Ku, Tokyo, JP;

MURATA MANUFACTURING CO., LTD., Nagaokakyo-Shi, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/041 (2006.01); C08L 67/04 (2006.01); G01L 1/16 (2006.01); H01L 41/193 (2006.01); H01L 41/113 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0414 (2013.01); C08L 67/04 (2013.01); G01L 1/16 (2013.01); G06F 3/041 (2013.01); H01L 41/1132 (2013.01); H01L 41/193 (2013.01); G06F 2203/04105 (2013.01);
Abstract

The invention provides a pressure detecting device containing a pressurized member having a contact surface that is subjected to pressure due to contact with a pressurizing means; and a piezoelectric member that is arranged facing the pressurized member and that includes a polymeric piezoelectric material having a piezoelectric constant dof 1 pm/V or more as measured by a displacement method at 25° C., and a ratio IEb/IEa between a product IEb of a cross-sectional secondary moment Ib and a Young's modulus Eb of the pressurized member, and a product IEa of a cross-sectional secondary moment Ia and a Young's modulus Ea of the piezoelectric member, is in a range of from 10to 10.


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