The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2018

Filed:

May. 20, 2016
Applicants:

Mariko Takii, Kanagawa, JP;

Yoshihiro Murasawa, Shizuoka, JP;

Takahiro Nakamura, Shizuoka, JP;

Kei Niwayama, Shizuoka, JP;

Haruki Murata, Kanagawa, JP;

Masato Taikoji, Shizuoka, JP;

Koichi Sakata, Shizuoka, JP;

Inventors:

Mariko Takii, Kanagawa, JP;

Yoshihiro Murasawa, Shizuoka, JP;

Takahiro Nakamura, Shizuoka, JP;

Kei Niwayama, Shizuoka, JP;

Haruki Murata, Kanagawa, JP;

Masato Taikoji, Shizuoka, JP;

Koichi Sakata, Shizuoka, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 9/113 (2006.01); G03G 9/107 (2006.01); G03G 15/08 (2006.01);
U.S. Cl.
CPC ...
G03G 9/1139 (2013.01); G03G 9/1075 (2013.01); G03G 9/1133 (2013.01); G03G 15/08 (2013.01);
Abstract

A carrier includes a resin layer including Al and Sn and covering the surface of the carrier. A detectable amount of Al is from 1.0% to 12.1% by atom and a ratio (Al/Sn) of the detectable amount of Al to that of Sn is from 2.0 to 50.0 when the carrier is subjected to an X-ray photoelectron spectroscopic (XPS) analysis.


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