The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2018

Filed:

Jul. 24, 2015
Applicant:

General Electric Company, Schenectady, NY (US);

Inventor:

Paul C. Goodwin, Issaquah, WA (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); H04N 9/47 (2006.01); G02B 21/36 (2006.01); G02B 21/00 (2006.01); G06K 9/00 (2006.01); G06T 5/00 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G02B 21/008 (2013.01); G02B 21/0076 (2013.01); G06K 9/00134 (2013.01); G06T 5/003 (2013.01); H04N 5/23229 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/30024 (2013.01);
Abstract

Example embodiments relate to systems and methods for processing an image in optical microscopy, such as for a CMOS camera used as an optical detector in a line confocal fluorescent imager. The method includes acquiring a raw image with a microscope, and asymmetrically deconvolving at least a portion of the raw image using a point-spread function that is different in an X-direction than in a Y-direction in order to generate an asymmetrically deconvolved image. When the image is a monochromatic fluorescence image, the method also includes compressing CMOS camera noise. Also provided is a system for processing an image in optical microscopy and an image processing system for processing a monochromatic image from a CMOS camera-based line-scan confocal fluorescent microscope.


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