The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
Aug. 27, 2014
Imagine Optic, Orsay, FR;
Centre National DE LA Recherche Scientifique—cnrs, Paris, FR;
Université DE Bordeaux Segalen, Bordeaux, FR;
Xavier Levecq, Gif-sur-Yvette, FR;
Virgile Viasnoff, Vanves, FR;
Jean-Baptiste Sibarita, Talence, FR;
Vincent Studer, Bordeaux, FR;
Rémi Galland, Pessac, FR;
IMAGINE OPTIC, Orsay, FR;
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE (CNRS), Paris, FR;
Université de Bordeaux, Bordeaux, FR;
Abstract
According to one aspect, the invention concerns a method for microscopy of a thick sample arranged on a sample support, with edge-illumination of the sample. The method comprises, in particular, emitting at least one illumination beam (), forming, from the illumination beam, an illumination surface, focusing the illumination surface in the sample by means of a microscope lens () and deflecting the illumination surface originating from the microscope lens, in order to form a transverse illumination surface, located in a plane substantially perpendicular to the optical axis of the microscope lens. The method further comprises forming, by means of said microscope lens (), the image of an area of the sample illuminated by the transverse illumination surface on a detection surface () of a detection device (), scanning the illumination beam, allowing the transverse illumination surface to move along the optical axis of the microscope lens, and superimposing the object imaging surface and the transverse illumination surface, by focusing means comprising means separate from the means for the relative axial movement of the microscope lens and the sample.