The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
Mar. 28, 2014
Mechaless Systems Gmbh, Bruchsal, DE;
Uwe Hendrik Hill, Remchingen, DE;
Mechaless Systems GMBH, Bruchsal, DE;
Abstract
In a method for optically measuring the properties of at least one measurement path (I, I) between a transmitter (H) and a receiver (D), the receiver (D) receives an optical signal from a compensation transmitter (K) in addition to an optical signal from the transmitter (H). The signal of the transmitter (H) is reflected by an object (O) or is transmitted to the receiver (D) by means of said object in a different manner. The output signal (SO) of the receiver (D) is fed to a controller (CT), which changes the transmitter feed signal (S) and/or compensation feed signal (S) in accordance with a control algorithm. In the process, the controller (CT) determines two signals or values, which represent control parameters (S, Sφ) for magnitude and phase or magnitude and delay. In a stage downstream of the controller (CT), the presence and/or the distance (r) of an object (O) is determined from said two control parameters (S, Sφ) in dependence on at least one of said two parameters, either from both parameters or from one of the two parameters.