The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
Aug. 20, 2014
Hitachi, Ltd., Tokyo, JP;
Hikaru Hanada, Tokyo, JP;
Miyuki Takahashi, Tokyo, JP;
Kuniharu Oka, Tokyo, JP;
Masahiro Takizawa, Tokyo, JP;
HITACHI, LTD., Tokyo, JP;
Abstract
The present invention obtains high-quality images even in a case of measurement with a radial sampling method. For this purpose, pre-measurement is performed to extract only a component different for each blade from among shift amounts from among echo signals, and a shift amount in k-space of an echo signal by the said component is reflected to a reconstruction process. In the pre-measurement, echo signals are obtained respectively by applying readout gradient magnetic field pulses that change the polarity to the positive and negative and that have the same pulse shape as readout gradient magnetic field pulses to be used in an image acquisition sequence. A shift amount is obtained for each axis of X, Y, and Z of an MRI apparatus as a variation amount of a phase difference between both the echo signals.