The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
Jun. 03, 2016
Applicant:
Samsung Medison Co., Ltd., Hongcheon-gun, KR;
Inventors:
Tae-ho Jeon, Seoul, KR;
Jong-keun Song, Yongin-si, KR;
Assignee:
SAMSUNG MEDISON CO., LTD., Hongcheon-gun, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01); G01N 29/24 (2006.01); B06B 1/02 (2006.01); G01S 7/52 (2006.01); A61B 8/06 (2006.01); A61B 8/00 (2006.01); A61B 8/08 (2006.01);
U.S. Cl.
CPC ...
G01R 31/02 (2013.01); A61B 8/4483 (2013.01); A61B 8/58 (2013.01); B06B 1/0207 (2013.01); G01N 29/24 (2013.01); G01S 7/5205 (2013.01); A61B 8/06 (2013.01); A61B 8/4405 (2013.01); A61B 8/4472 (2013.01); A61B 8/483 (2013.01); A61B 8/488 (2013.01); A61B 8/565 (2013.01);
Abstract
Provided is a method of controlling an operation of a channel including at least one transducer, which includes comparing a voltage corresponding to current flowing into the channel to a threshold voltage and controlling the operation of the channel based on a result of the comparing.
Jeon, Tae-ho. (2018). Method and apparatus for determining occurrence of electrical fault in channel of ultrasound probe (U.S. Patent No. 10031172). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10031172
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile