The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2018

Filed:

Feb. 04, 2016
Applicant:

Src, Inc., North Syracuse, NY (US);

Inventor:

Michael Robinson, Drexel Hill, PA (US);

Assignee:

SRC, Inc., North Syracuse, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/10 (2006.01); H01Q 3/26 (2006.01);
U.S. Cl.
CPC ...
G01R 29/10 (2013.01); H01Q 3/267 (2013.01);
Abstract

The present invention is directed to a system and method for providing an estimated design specification as a function of a number of spatially separated far-field measurements and a predetermined design specification. The predetermined design specification corresponds to an antenna being in a properly configured and a properly excited state. The system maps the spatially separated far-field measurements into an estimated far-field antenna pattern of the antenna based on the estimated design specification. The system provides difference data based on a comparison of the predetermined design specification and the estimated design specification and can adjust the electrical excitation signals of the antenna in accordance with the difference data or the estimated far-field antenna pattern.


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