The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
Jan. 20, 2014
Hitachi, Ltd., Chiyoda-ku, Tokyo, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
It is an object to provide an electromagnetic wave measuring apparatus and an electromagnetic wave measuring method that suppress deterioration in sensitivity of electromagnetic noise in electromagnetic wave measurement. An electromagnetic wave measuring apparatus includes a sensor that detects an electromagnetic wave and outputs a detection signal having intensity corresponding to the magnitude of energy of the detected electromagnetic wave, a resistor connected to the sensor, a first variable capacitor connected to the sensor, a voltage detection circuit connected to the sensor, a second variable capacitor connected to a wire between the sensor and the voltage detection circuit, and a capacitance adjusting unit that adjusts capacitance values of the first variable capacitor and the second variable capacitor. The electromagnetic wave measuring apparatus adjusts, in the adjusting unit, the capacitance values of the first and second variable capacitors and performs electromagnetic wave measurement.