The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
Oct. 05, 2012
Koninklijke Philips N.v., Eindhoven, NL;
Sytske Foppen, Riethoven, NL;
Bernardus Jozef Maria Beerling, Heeseijk-Dinther, NL;
Willemina Maria Huijnen-Keur, Boxtel, NL;
Hendrik Jan De Graaf, Eindhoven, NL;
Danielle Walthera Maria Kemper-Van De Wiel, Eindhoven, NL;
Roland Antonius Johannes Gerardus Smits, Breda, NL;
Albert Hendrik Jan Immink, Eindhoven, NL;
Femke Karina De Theije, Berghem, NL;
Wendela Meertens, Eindhoven, NL;
Minicare B.V., Eindhoven, NL;
Abstract
The invention relates to a method and a device for the detection of magnetic particles () in a sample chamber (). After introduction of the sample into said sample chamber (), the magnetic particles () are first retained within the sample chamber () and kept away from the sensing surface () by an appropriate magnetic field (B) to allow for an incubation of the sample with reagents. A reference measurement may be made during this incubation period (T), preferably at the end thereof. After incubation, the magnetic particles () are allowed to contact the sensing surface () where a target measurement can be conducted.