The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
Mar. 26, 2013
National Institutes for Quantum and Radiological Science and Technology, Chiba-shi, Chiba, JP;
Emiko Sekine, Chiba, JP;
Takashi Shimokawa, Chiba, JP;
Megumi Ueno, Chiba, JP;
Etsuko Nakamura, Chiba, JP;
Miyako Nakawatari, Chiba, JP;
Takeshi Murakami, Chiba, JP;
Takashi Imai, Chiba, JP;
Kazunori Anzai, Chiba, JP;
Kenichiro Matsumoto, Chiba, JP;
Ikuo Nakanishi, Chiba, JP;
Abstract
A screening method evaluates influence of a cytotoxic factor on lymphoid cells. The method includes administering or irradiating lymphoid cells with the cytotoxic factor that injures the lymphoid cells; incubating the lymphoid cells to which the cytotoxic factor is administered or irradiated for a selected time; measuring a cell size of the lymphoid cells after the incubation; and determining influence of the cytotoxic factor on the lymphoid cells based on a change of the cell size. According to this method, influence of radiation or a drug, or efficacy of radiation, a radiation-protecting agent, an antioxidant, a radiation-sensitizing agent, a drug, or ultraviolet rays can be evaluated economically and objectively in a short period of time.