The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
Nov. 19, 2013
Universiteit Twente, Enschede, NL;
Sebastiaan Waanders, Enschede, NL;
Martijn Visscher, Enschede, NL;
Tasio Olmo Borendissi Oderkerk, Enschede, NL;
Hendrikus Johannes Gradus Krooshoop, Enschede, NL;
Bernard Haken, Enschede, NL;
UNIVERSITEIT TWENTE, Enschede, NL;
Abstract
Method and apparatus for measuring an amount of superparamagnetic material in an object, the method including a) applying a magnetic field having a first component alternating with a first period to the object and a magnetic field strength lower than a magnetic field strength at which the superparamagnetic material is driven in saturation; b) measuring a first magnetic susceptibility of the object with a detection coil; c) applying a static second component to the magnetic field for a second period being equal or larger than the first period, the strength of the magnetic field during the second period is such that the superparamagnetic material is driven towards saturation; d) measuring a second magnetic susceptibility of the object with the detection coil during the application of the static second component; and e) determining the amount of superparamagnetic material from a difference between the measured first and second susceptibility of the object.