The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
Oct. 13, 2016
International Business Machines Corporation, Armonk, NY (US);
Khajistha Fattu, Austin, TX (US);
Michael Fattu, Austin, TX (US);
Rachael C. Freitas, Austin, TX (US);
George Zacharakis-Jutz, Austin, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Embodiments herein describe a universal test platform that includes a universal test station (UTS) coupled to a system under test (SUT) using respective adapters. The adapters include an interface subdivided into portions that are assigned to different data and power standards. In one embodiment, the UTS is coupled to a UTS adapter using a plurality of cables that transmits the different data and power signals between the UTS and the adapter. For example, the interface in the UTS adapter may include a plurality of pins or optical channels that are each coupled to one of the plurality of cables. The SUT is coupled to a SUT adapter which may have the same interface as the UTS adapter. However, the SUT may be coupled to only a sub-portion of the I/O elements in the SUT adapter, and thus, only some of the I/O elements are used when testing the SUT.