The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2018

Filed:

Jan. 19, 2017
Applicants:

Tsinghua University, Beijing, CN;

Hon Hai Precision Industry Co., Ltd., New Taipei, TW;

Inventors:

Ling Zhang, Beijing, CN;

Yang Wu, Beijing, CN;

Kai-Li Jiang, Beijing, CN;

Chang-Hong Liu, Beijing, CN;

Jia-Ping Wang, Beijing, CN;

Shou-Shan Fan, Beijing, CN;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01); G01J 9/00 (2006.01); G01J 3/50 (2006.01); G01J 1/04 (2006.01); G01J 1/42 (2006.01); G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
G01J 9/00 (2013.01); G01J 1/0429 (2013.01); G01J 1/42 (2013.01); G01J 3/50 (2013.01); G01J 4/00 (2013.01); G01J 5/023 (2013.01); G01J 2003/507 (2013.01);
Abstract

An optical wavelength detecting device, the device including: a polarizer configured to transform an incident light into a polarized light; a detecting element configured to receive the polarized light and form a temperature difference or a potential difference between two points of the detecting element, wherein the detecting element comprises a carbon nanotube structure including a plurality of carbon nanotubes oriented along the same direction, and angles between a polarizing direction of the polarized light and an oriented direction of the plurality of carbon nanotubes is adjustable; a measuring device electrically connected to the detecting element and configured to measure the temperature difference or the potential difference; a data processor electrically connected to the measuring device and configured to obtain the optical wavelength by calculating and analyzing the temperature difference or the potential difference.


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