The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2018

Filed:

Jan. 14, 2016
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Eiichi Tanaka, Kanagawa, JP;

Yusaku Nakashima, Tokyo, JP;

Isamu Nakao, Tokyo, JP;

Noriyuki Kishii, Kanagawa, JP;

Takuya Kishimoto, Kanagawa, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/44 (2006.01); G01J 3/02 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01J 3/02 (2013.01); G01N 21/4788 (2013.01); G01N 2021/479 (2013.01);
Abstract

Provided is a highly accurate imaging technology that utilizes the speckle interference. The present technology provides a speckle imaging device including: an irradiation condition setting unit that sets an irradiation condition for coherent light with which an imaging object is irradiated; an imaging unit that captures scattered light obtained from the imaging object irradiated with the coherent light; an image generation unit that generates a speckle-enhanced image from a captured image captured by the imaging unit; and a leveling processing unit that generates a leveled speckle image from speckle-enhanced images corresponding to two or more different irradiation conditions.


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