The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2018

Filed:

Mar. 09, 2016
Applicant:

Siemens Aktiengesellschaft, Munich OT, DE;

Inventor:

Gordon Green, Bristol, GB;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/342 (2014.01); B29C 67/00 (2017.01); B22F 3/105 (2006.01); B33Y 30/00 (2015.01); B29C 64/129 (2017.01); B29C 64/282 (2017.01); B29C 64/277 (2017.01); B29C 64/135 (2017.01); B23K 26/082 (2014.01); B23K 26/046 (2014.01); B33Y 10/00 (2015.01);
U.S. Cl.
CPC ...
B23K 26/342 (2015.10); B22F 3/1055 (2013.01); B23K 26/046 (2013.01); B23K 26/082 (2015.10); B29C 64/129 (2017.08); B29C 64/135 (2017.08); B29C 64/277 (2017.08); B29C 64/282 (2017.08); B29C 67/0066 (2013.01); B29C 67/0077 (2013.01); B29C 67/0085 (2013.01); B29C 67/0088 (2013.01); B33Y 30/00 (2014.12); B22F 2003/1056 (2013.01); B22F 2003/1057 (2013.01); B33Y 10/00 (2014.12);
Abstract

A method is for additive layer manufacturing an article from a material which can be rendered solid locally by the application of a focused beam of laser radiation. The method includes providing at least two laser beams, providing a scanner for each laser beam for scanning each laser beam over an entire planar field, providing a support moveable step wise to support material within the field, scanning the laser beams simultaneously but separated over the field to render solid the desired portions of material contained in the field to perform a manufacturing cycle and stepping the support after each cycle. At least one scanner is tilted with respect to the common planar field, and the method further includes the step of tilting the focal plane of the laser beam from the said at least one scanner.


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