The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
Dec. 03, 2015
Applicants:
Peter Bartl, Erlangen, DE;
Anna Jerebko, Hausen, DE;
Tom Weidner, Erlangen, DE;
Inventors:
Assignee:
Siemens Aktiengesellschaft, München, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/03 (2006.01); A61B 6/00 (2006.01); A61B 6/02 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5205 (2013.01); A61B 6/025 (2013.01); A61B 6/4233 (2013.01); A61B 6/502 (2013.01); A61B 6/54 (2013.01); A61B 6/542 (2013.01); A61B 6/58 (2013.01);
Abstract
Data of a predetermined volume portion of an object under examination is captured by an x-ray system that includes an x-ray source and a detector. The x-ray source is activated to generate x-rays that emerge from the x-ray source, radiate through the volume portion, and after radiating through, impinge on the detector. X-rays impinging on the detector are captured pixel by pixel, in order to capture the data of the predetermined volume portion. With the pixel-by-pixel capture, only a subset of all the pixels of the detector is evaluated.