The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
Oct. 12, 2011
Ewald Rössl, Ellerau, DE;
Ewald Rössl, Ellerau, DE;
KONIKLIJKE PHILIPS N.V., Eindhoven, NL;
Abstract
The present invention relates to differential phase-contrast imaging, in particular to a structure of a diffraction grating, e.g. an analyzer grating and a phase grating, for X-ray differential phase-contrast imaging. In order to make better use of the X-ray radiation passing the object, a diffraction grating () for X-ray differential phase-contrast imaging is provided with at least one portion () of a first sub-area () and at least one portion () of a second sub-area (). The first sub-area comprises a grating structure () with a plurality of bars () and gaps () being arranged periodically with a first grating pitch P G (), wherein the bars are arranged such that thy change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent. The second sub-area is X-ray transparent and wherein the at least one portion of the second sub-area provides an X-raytransparent aperture () in the grating. Portions of the first and second sub-areas are arranged in an alternating manner in at least one direction ().