The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2018
Filed:
Aug. 29, 2017
Fujifilm Corporation, Tokyo, JP;
Atsushi Hashimoto, Ashigarakami-gun, JP;
Kaku Irisawa, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
In a photoacoustic measurement apparatus and a probe, artifacts due to photoacoustic waves generated in a surface portion of a subject are reduced without increasing the repetition period of photoacoustic measurement. A measurement light emitting unit emits measurement light toward a subject. An acoustic wave detector detects photoacoustic waves generated within the subject due to the measurement light. A correction light source emits correction light toward the subject. A light intensity detector detects reflected light generated by reflection of the correction light, which is emitted toward the subject, from the subject. In a probe, the correction light source and the light intensity detector are disposed between the measurement light emitting unit and the acoustic wave detector.