The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
Sep. 06, 2016
Qualcomm Incorporated, San Diego, CA (US);
Amit Jain, San Diego, CA (US);
Harisrinivas Chandrasekar, San Diego, CA (US);
Borislav Ristic, Del Mar, CA (US);
Dinesh Subramani, San Diego, CA (US);
Gautam Nirula, San Diego, CA (US);
Prabhu Kandasamy, San Diego, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Disclosed embodiments pertain to combining Reference Signal Time Difference (RSTD) measurements from partial measurement sessions that result when a single measurement session is interrupted by one or more interruption events including Out of Service (OOS) or Inter-Frequency Handover (IFH) events. In some embodiments, first Time Of Arrival (TOA) measurements of cellular signals during a plurality of discontiguous partial measurement sessions separated by one or more interruption events may be obtained. Second TOA measurements based on a reference time source may be obtained for a plurality of the first TOA measurements from at least two partial measurement sessions. A cell associated with a second TOA measurement may be selected as a reference cell and for each non-reference cell associated with a second TOA measurement, a corresponding RSTD measurement may be obtained relative to the selected reference cell.