The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
May. 30, 2012
Applicants:
Zhipeng Zhao, Sunnyvale, CA (US);
Yanlin Wang, San Jose, CA (US);
Anurag Singla, Cupertino, CA (US);
Inventors:
Zhipeng Zhao, Sunnyvale, CA (US);
Yanlin Wang, San Jose, CA (US);
Anurag Singla, Cupertino, CA (US);
Assignee:
ENTIT SOFTWARE LLC, Sunnyvale, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); H04L 29/06 (2006.01); H04L 12/26 (2006.01); G06F 12/14 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1408 (2013.01); H04L 43/04 (2013.01);
Abstract
Pattern discovery performed on event data may include selecting an initial set of parameters for the pattern discovery. The parameters may specify conditions for identifying a pattern in the event data. A pattern discovery run is executed on the event data based on the initial set of parameters, and a parameter may be adjusted based on the output of the pattern discovery run.