The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Apr. 04, 2016
Applicant:

Facebook, Inc., Menlo Park, CA (US);

Inventor:

Sanjai Kohli, Manhattan Beach, CA (US);

Assignee:

Facebook, Inc., Menlo Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 7/0408 (2017.01); H04W 40/14 (2009.01); H04W 40/02 (2009.01); H04W 40/12 (2009.01); H04W 24/04 (2009.01); H04B 15/00 (2006.01); H04L 12/707 (2013.01); H04W 40/34 (2009.01); H04W 72/04 (2009.01); H04W 28/18 (2009.01); H04W 56/00 (2009.01); H04L 12/751 (2013.01); H04L 12/715 (2013.01); H04W 72/12 (2009.01); H04W 24/02 (2009.01); H04W 52/42 (2009.01); H04W 72/08 (2009.01); H04W 16/28 (2009.01); H04W 24/10 (2009.01); H04W 40/16 (2009.01); H04B 7/06 (2006.01); H04W 72/00 (2009.01); H04L 1/18 (2006.01); H04W 84/22 (2009.01);
U.S. Cl.
CPC ...
H04B 7/0408 (2013.01); H04B 7/0617 (2013.01); H04B 15/00 (2013.01); H04L 45/02 (2013.01); H04L 45/22 (2013.01); H04L 45/46 (2013.01); H04W 16/28 (2013.01); H04W 24/02 (2013.01); H04W 24/04 (2013.01); H04W 24/10 (2013.01); H04W 28/18 (2013.01); H04W 40/02 (2013.01); H04W 40/12 (2013.01); H04W 40/14 (2013.01); H04W 40/16 (2013.01); H04W 40/34 (2013.01); H04W 52/42 (2013.01); H04W 56/00 (2013.01); H04W 72/0453 (2013.01); H04W 72/0473 (2013.01); H04W 72/085 (2013.01); H04W 72/1263 (2013.01); H04L 1/1867 (2013.01); H04W 72/00 (2013.01); H04W 84/22 (2013.01); Y02D 70/00 (2018.01); Y02D 70/12 (2018.01); Y02D 70/122 (2018.01); Y02D 70/164 (2018.01); Y02D 70/22 (2018.01); Y02D 70/34 (2018.01);
Abstract

Methods, systems and apparatuses for selecting parameters of a beam are disclosed. One method includes selecting, by a network controller of a wireless network, coarse beam parameters of each of a plurality of antenna arrays of a first node or a second node of the wireless network based on one or more static parameters of the first node and the second node, selecting, by at least one of the first node or the second node of the wireless network, fine beam parameters of each of the plurality of antenna arrays of the first node or the second node based on perturbations to dynamic parameters of at least one wireless link between the first node and the second node, and forming at least one beam by at least one of the first node or the second node using the coarse beam parameters and the fine beam parameters.


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