The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Oct. 31, 2016
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Makoto Ishiguro, Kanagawa, JP;

Akira Yamamoto, Kanagawa, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 51/52 (2006.01); B32B 7/02 (2006.01); B32B 7/12 (2006.01); G02B 5/30 (2006.01);
U.S. Cl.
CPC ...
H01L 51/5293 (2013.01); B32B 7/02 (2013.01); B32B 7/12 (2013.01); G02B 5/3016 (2013.01); G02B 5/3041 (2013.01); H01L 51/5281 (2013.01); B32B 2307/412 (2013.01); B32B 2307/418 (2013.01); B32B 2307/42 (2013.01); B32B 2457/206 (2013.01);
Abstract

The present invention provides an organic EL display device in which external light reflection and tinting are suppressed when viewed from a front and an oblique direction, and includes a polarizer, a first optically anisotropic layer, a λ/4 plate, and an organic EL display panel in this order from a viewing side, where an angle formed between an absorption axis of the polarizer and an in-plane slow axis of the λ/4 plate is within a range of 45±3°, an Nz factor of the first layer is −0.1 or more and 1.1 or less, the absorption axis of the polarizer is parallel with or orthogonal to the in-plane slow axis of the first layer, and Re(550), which is an in-plane retardation value of the first layer measured at a wavelength of 550 nm, satisfies the following Equation (X).100 nm≤Re(550)≤450 nm.  Equation (X)


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