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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 10026587 B1

PDFFull Text
Expired
Date of Patent:
Jul. 17, 2018

Filed:

Dec. 09, 2016

Sample holder for scanning electron microscopy (sem) and atomic force microscopy (afm)

Applicant:

Instituto Mexicano Del Petróleo, Mexico City, MX;

Inventors:

Florentino Leyte Guerrero, México, D.F., MX;

Ubaldo Sadott Pacheco y Alcalá, México, D.F., MX;

David Velázquez Cruz, México, D.F., MX;

Galicia Mabel Acosta Garate, México, D.F., MX;

Assignee:

Instituto Mexicano del Petróleo, Mexico City, MX;

Attorneys:

Anne M. Reynolds

Casimir Jones, S.C.

Primary Examiner:

David A Vanore

Int. Cl.
CPC ...
B82Y 35/00 (2011.01); G01Q 60/38 (2010.01); H01J 37/20 (2006.01); G01Q 30/02 (2010.01); G01Q 30/20 (2010.01); H01J 37/28 (2006.01);
U.S. Cl.
CPC ...
H01J 37/20 (2013.01); G01Q 30/02 (2013.01); G01Q 30/20 (2013.01); H01J 37/28 (2013.01); H01J 2237/2826 (2013.01);
Abstract

The present invention refers to a two-systems compact specimen holder (SH) easy to use which enables to analyze the same sample by employing either an atomic force microscope (AFM) or a scanning electron microscope (SEM), by preserving the setting reference of the details for both microscopies, so that it satisfies the requirements of size, conductivity, magnetization, tidiness, reference and adaptability. The capacity of preserving the location reference of the details for both microscopies, in the scope of correlational microscopy, results essential to obtain information and images in both fields of microscopy, which can be correlated in order to acquire valuable combined information.

Find Patent Forward Citations

Leyte Guerrero, Florentino. (2018). Sample holder for scanning electron microscopy (sem) and atomic force microscopy (afm) (U.S. Patent No. 10026587). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10026587

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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