The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
Sep. 13, 2016
Applicant:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Inventor:
Toru Ezawa, Kanagawa, JP;
Assignee:
Kabushiki Kaisha Toshiba, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G07C 5/08 (2006.01); B61K 9/00 (2006.01); B61L 27/00 (2006.01); G06N 99/00 (2010.01); B61L 15/00 (2006.01); B61L 25/02 (2006.01); B61L 25/04 (2006.01);
U.S. Cl.
CPC ...
G07C 5/0808 (2013.01); B61K 9/00 (2013.01); B61L 15/0081 (2013.01); B61L 27/0038 (2013.01); B61L 27/0055 (2013.01); B61L 27/0094 (2013.01); G06N 99/005 (2013.01); B61L 25/021 (2013.01); B61L 25/025 (2013.01); B61L 25/04 (2013.01);
Abstract
According to one embodiment, an abnormality diagnostic device includes processing circuitry. The processing circuitry learns, based on a model generated from sensor data of a diagnostic object in a railroad vehicle, a data selection condition for selecting the sensor data utilized to diagnose the diagnostic object. The processing circuitry diagnoses abnormality of the diagnostic object based on the sensor data satisfying the data selection condition and a diagnostic model representing a relation between the sensor data and the abnormality of the diagnostic object.