The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
Oct. 27, 2016
Samsung Electronics Co., Ltd., Suwon-si, KR;
SAMSUNG ELECTRONICS CO., LTD., Suwon-si, Gyeonggi-Do, KR;
Abstract
A ray tracing apparatus includes a traversal (TRV) core configured to traverse an acceleration structure (AS) to detect a first node and a second node, which intersect with a generated ray and have a determined same parent node, and to determine whether the ray intersects with an overlap region where a first bounding box corresponding to the first node overlaps a second bounding box corresponding to the second node; and, an intersection test (IST) determiner configured to calculate a first hit point where the ray intersects with a primitive belonging to the first node, which is a closer node to a view point of the ray among the first node and the second node, and to determine a final hit point of the ray based on a result of the determining of whether the ray intersects with respect to an overlap region, by the TRV core.