The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
Sep. 13, 2017
Siemens Healthcare Gmbh, Erlangen, DE;
Herbert Bruder, Hoechstadt, DE;
Karl Stierstorfer, Erlangen, DE;
SIEMENS HEALTHCARE GMBH, Erlangen, DE;
Abstract
A method is for imaging of an examination region of an object to be examined with a computed tomography system. In an embodiment, the method includes recording of first and second projection measurement data with a common x-ray source-detector system, the first projection measurement data being recorded with a first x-ray spectrum in a first angular sector and the second projection measurement data being recorded with a second x-ray spectrum in a second angular sector; Creation of first and second start image data from the first and second projection measurement data via a first reconstruction method; and coupled iterative reconstruction of first result image data on the basis of the first start image data and of second result image data on the basis of the second start image data, the first result image data and the second result image data each featuring a complete image of the examination region.