The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 17, 2018

Filed:

Jan. 13, 2012
Applicants:

Sung-wei Chen, Las Vegas, NV (US);

Christopher J. Rothfuss, Laramie, WY (US);

Inventors:

Sung-Wei Chen, Las Vegas, NV (US);

Christopher J. Rothfuss, Laramie, WY (US);

Assignee:

EMPIRE TECHNOLOGY DEVELOPMENT LLC, Wilmington, DE (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 19/06 (2006.01); B07C 5/34 (2006.01);
U.S. Cl.
CPC ...
G06K 19/06178 (2013.01); B07C 5/3412 (2013.01); G06K 19/06065 (2013.01); G06K 2019/0629 (2013.01); Y10T 29/49826 (2015.01);
Abstract

A system and method for identifying information related to an object. A radiation emitter is configured to direct radiation toward an object, the object including one or more diffraction gratings including encoded information related to the object. A detector is configured to receive modified radiation from the one or more diffraction gratings on the object and transfer the received modified radiation to a processing device operably connected to the detector. The processing device is configured to process the modified radiation and decode the information related to the object encoded in the one or more diffraction gratings.


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