The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
Dec. 28, 2016
Applicant:
Konica Minolta Laboratory U.s.a., Inc., San Mateo, CA (US);
Inventors:
Saman Sarraf, San Carlos, CA (US);
Duanduan Yang, San Jose, CA (US);
Assignee:
KONICA MINOLTA LABORATORY U.S.A., INC., San Mateo, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06T 5/00 (2006.01); G06T 5/20 (2006.01); G06K 9/42 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00409 (2013.01); G06K 9/42 (2013.01); G06K 9/4642 (2013.01); G06K 9/6256 (2013.01); G06K 9/6262 (2013.01); G06T 5/002 (2013.01); G06T 5/20 (2013.01);
Abstract
Disclosed herein is a method of optimizing data normalization by selecting the best height normalization setting from training RNN (Recurrent Neural Network) with one or more datasets comprising multiple sample images of handwriting data, which comprises estimating a few top place ratios for normalization by minimizing a cost function for any given sample image in the training dataset, and further, determining the best ratio from the top place ratios by validating the recognition results of sample images with each top place ratio.