The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 17, 2018
Filed:
Jul. 10, 2015
Advanced Testing Technologies, Inc., Hauppauge, NY (US);
Eli Levi, Dix Hills, NY (US);
Shahen Minassian, Dix Hills, NY (US);
John L Baker, South Setauket, NY (US);
Eli Levi, Dix Hills, NY (US);
Advanced Testing Technologies, Inc., Hauppauge, NY (US);
Abstract
Method for generating a model of the effect of phase noise during use of a Doppler radar system including calculating, using a processor, an initial signal-to-clutter ratio (SCR) representing a ratio of power received from echoes from a target by the radar system to power resulting from clutter reflection received by the radar system. The initially calculated SCR is modified as a function of a range ambiguity and range resolution. A Doppler frequency of interest is calculated based on velocity of a target, target heading and radar frequency, along with a Doppler filter bandwidth, frequency components and a measure of clutter signal passing through the Doppler filter of interest by summing products of the phase noise for each frequency by the Doppler filter bandwidth. This measure indicates effectiveness of target detection by the Doppler radar system as a function of distance.